Kamat, Vishnu : rechercher sur Z-Library

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1

Advanced rail clamp networks for ESD protection

Michael Stockinger, James W. Miller, Michael G. Khazhinsky, Cynthia A. Torres, James C. Weldon, Bryan D. Preble, Martin J. Bayer, Matthew Akers, Vishnu G. Kamat

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 454 KB

english, 2005

2

Microarray ratio analysis under noisy background

Chen, Yidong, Kamat, Vishnu, Dougherty, Edward R., Bittner, Michael L., Meltzer, Paul S., Trent, Jeffery M.

Journal:

Nature Genetics

Année:

1999

Langue:

english

Fichier:

PDF, 97 KB

english, 1999

3

Multiresolution Bayesian design of binary filters

Kamat, Vishnu G.

Journal:

Journal of Electronic Imaging

Année:

2000

Langue:

english

Fichier:

PDF, 222 KB

english, 2000

4

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, CA (Sunday 22 February 2009)] Optical Microlithography XXII - Enabling process window improvement at 45nm and 32nm with free-form DOE illumination

Coskun, Tamer H., Sezginer, Apo, Kamat, Vishnu, Kruger, Michiel, Yenikaya, Bayram, Carriere, James, Stack, Jared, Himel, Marc, Levinson, Harry J., Dusa, Mircea V.

Année:

2009

Langue:

english

Fichier:

PDF, 941 KB

english, 2009

5

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Optical Microlithography XXV - Free form source and mask optimization for negative tone resist development for 22nm node contact holes

Coskun, Tamer H., Dai, Huixiong, Kamat, Vishnu, Hsu, Ching-Mei, Santoro, Gaetano, Ngai, Chris, Reybrouck, Mario, Grozev, Grozdan, Huang, Hsu-Ting, Conley, Will

Année:

2012

Langue:

english

Fichier:

PDF, 4.61 MB

english, 2012

6

SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Nonlinear Image Processing and Pattern Analysis XII - Bayesian iterative binary filter design

Kamat, Vishnu G., Dougherty, Edward R., Dougherty, Edward R., Astola, Jaakko T.

Année:

2001

Langue:

english

Fichier:

PDF, 223 KB

english, 2001

7

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Optical Microlithography XXIV - Accounting for mask topography effects in source-mask optimization for advanced nodes

Coskun, Tamer H., Dai, Huixiong, Huang, Hsu-Ting, Kamat, Vishnu, Ngai, Chris

Année:

2011

Langue:

english

Fichier:

PDF, 2.65 MB

english, 2011

8

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Design and Process Integration for Microelectronic Manufacturing IV - RET for the wiring layer of a 3D memory

Chen, Yung-Tin, Wong, Alfred K. K., Singh, Vivek K., Poon, Paul, Petti, Chris, Kamat, Vishnu, Sezginer, Apo, Huang, Hsu-Ting

Année:

2006

Langue:

english

Fichier:

PDF, 536 KB

english, 2006

9

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Optical Microlithography XXIV - DPT restricted design rules for advanced logic applications

Deng, Yunfei, Ma, Yuangsheng, Yoshida, Hidekazu, Kye, Jongwook, Levinson, Harry J., Sweis, Jason, Coskun, Tamer H., Kamat, Vishnu

Année:

2011

Langue:

english

Fichier:

PDF, 1.35 MB

english, 2011

10

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Optical Microlithography XXIV - Custom source and mask optimization for 20nm SRAM and logic

Smayling, Michael C., Coskun, Tamer H., Kamat, Vishnu

Année:

2011

Langue:

english

Fichier:

PDF, 1.03 MB

english, 2011

11

SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Nonlinear Image Processing XI - Bayesian multiresolution filter design

Kamat, Vishnu G., Dougherty, Edward R., Barrera, Junior, Dougherty, Edward R., Astola, Jaakko T.

Année:

2000

Langue:

english

Fichier:

PDF, 488 KB

english, 2000

12

SPIE Proceedings [SPIE BiOS 2000 The International Symposium on Biomedical Optics - San Jose, CA (Saturday 22 January 2000)] Advances in Nucleic Acid and Protein Analyses, Manipulation, and Sequencing - Expression ratio statistics and its applications to microarray data analysis

Chen, Yidong, Kamat, Vishnu G., Dougherty, Edward R., Bittner, Michael L., Meltzer, Paul S., Trent, Jeffrey M., Limbach, Patrick A., Owicki, John C., Raghavachari, Ramesh, Tan, Weihong

Année:

2000

Langue:

english

Fichier:

PDF, 352 KB

english, 2000

13

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Design and Process Integration for Microelectronic Manufacturing II - Hybrid AAPSM compliance methodology to ensure design for manufacturing

Kamat, Vishnu G., Liebmann, Lars W., Miloslavsky, Alexander, Malhotra, Vinod K., Mayhew, Jeffrey P., Cote, Michel L.

Année:

2004

Langue:

english

Fichier:

PDF, 577 KB

english, 2004

14

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Design and Process Integration for Microelectronic Manufacturing IV - Optimal segmentation of polygon edges

Sezginer, Apo, Wong, Alfred K. K., Singh, Vivek K., Yenikaya, Bayram, Huang, Hsu-Ting, Kamat, Vishnu, Chen, Yung-Tin

Année:

2006

Langue:

english

Fichier:

PDF, 630 KB

english, 2006

15

SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Real-Time Imaging V - Real-time large-window binary filter design

Kamat, Vishnu G., Dougherty, Edward R., Kehtarnavaz, Nasser

Année:

2001

Langue:

english

Fichier:

PDF, 218 KB

english, 2001

16

SPIE Proceedings [SPIE 26th Annual BACUS Symposium on Photomask Technology - Monterey, CA (Monday 18 September 2006)] Photomask Technology 2006 - PPC model build methodology: sequential litho and etch verification

Mokhberi, Ali, Martin, Patrick M., Naber, Robert J., Kamat, Vishnu, Sezginer, Apo, Zach, Franz X., Perçin, Gökhan, Carrero, Jesus, Huang, Hsu-Ting

Année:

2006

Langue:

english

Fichier:

PDF, 687 KB

english, 2006

17

SPIE Proceedings [SPIE Photomask 2001 - Monterey, CA (Wednesday 3 October 2001)] 21st Annual BACUS Symposium on Photomask Technology - Model-based OPC methodology for 0.13 micron technology

Kamat, Vishnu G., Dao, Giang T., Grenon, Brian J., Green, Kent G., Chheda, Sejal N., Muehle, Sven, Kolagunta, Venkat, Wilkinson, Bill, Philbin, Cecilia E.

Année:

2001

Langue:

english

Fichier:

PDF, 600 KB

english, 2001

18

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Monday 8 September 2003)] 23rd Annual BACUS Symposium on Photomask Technology - A new concept of image imbalance correction for phase-shift mask lithography at 65 nm

Kamat, Vishnu G., Kimmel, Kurt R., Staud, Wolfgang, Kroyan, Armen

Année:

2003

Langue:

english

Fichier:

PDF, 608 KB

english, 2003

19

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, CA (Monday 14 September 2009)] Photomask Technology 2009 - Calibration of e-beam and etch models using SEM images

Chuyeshov, Constantin, Zurbrick, Larry S., Montgomery, M. Warren, Carrero, Jesus, Sezginer, Apo, Kamat, Vishnu

Année:

2009

Langue:

english

Fichier:

PDF, 395 KB

english, 2009

20

Purification and characterisation of a sulphur rich melanin from edible mushroom Termitomyces albuminosus Heim

De Souza, Rosy Agnes, Kamat, Nandkumar Mukund, Nadkarni, Vishnu S.

Journal:

Mycology: An International Journal on Fungal Biology

Année:

2018

Langue:

english

Fichier:

PDF, 1.61 MB

english, 2018